Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
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SN74BCT8374ADW

DigiKey Part Number
296-33849-5-ND
Manufacturer
Manufacturer Product Number
SN74BCT8374ADW
Description
IC SCAN TEST DEVICE 8BIT 24-SOIC
Manufacturer Standard Lead Time
12 Weeks
Customer Reference
Detailed Description
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Datasheet
 Datasheet
EDA/CAD Models
SN74BCT8374ADW Models
Product Attributes
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Category
Number of Bits
8
Manufacturer
Texas Instruments
Operating Temperature
0°C ~ 70°C
Series
Mounting Type
Surface Mount
Packaging
Tube
Package / Case
24-SOIC (0.295", 7.50mm Width)
Part Status
Active
Supplier Device Package
24-SOIC
Logic Type
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Base Product Number
Supply Voltage
4.5V ~ 5.5V
Environmental & Export Classifications
Product Questions and Answers
Additional Resources
In-Stock: 30
Check for Additional Incoming Stock
Once available stock of this product has been depleted, manufacturer standard package and lead time will apply. View Alternative Package Types
All prices are in EUR
Tube
QuantityUnit PriceExt Price
111,68000 €11,68 €
109,20400 €92,04 €
258,58680 €214,67 €
Manufacturers Standard Package
Note: Due to DigiKey value-add services the packaging type may change when product is purchased at quantities beneath the standard package.
Unit Price without VAT:11,68000 €
Unit Price with VAT:13,89920 €