CX3225GA Series Spec Datasheet by Kyocera International Inc. Electronic Components

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Sgecification Deswgn Depanmem
KYOCERA Crystal Device Corporation
KBS-5079E
Specification
Drawing No. K1101-13753-431 1/11
Issued Date. Jul.29, 2013
TO: Digi-Key
NoteIn case of specification change, KYOCERA Part Number also will be changed.
Product Name Quartz Crystal
Product Model CX3225GA
Frequency Refer to K1101-13753-431 3/11 Nominal Frequency
Customer Part Number -
Customer Specification Number -
KYOCERA Part Number Refer to K1101-13753-431 3/11 KYOCERA Part Number
Remarks RoHS CompliantMSL 1
Confirmation of stable oscillation of a crystal oscillation circuit is necessary at the design stage to
prevent critical failures for automotive crystal units which are used to control vehicles and secure safety.
It is strongly recommended to provide us a test circuit board and let us
implement the circuit verification upon your use of our automotive crystal units.
Customer Acceptance
Accept Signature Approved Date
Department
Person in charge
Seller Manufacturer
KYOCERA Corporation KYOCERA Crystal Device Corporation
6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 5850, Higashine-Koh, Higashine-Shi, Yamagata
612-8501 Japan 999-3701 Japan
TEL. No. 075-604-3500 TEL. No. 0237-43-5611
FAX. No. 075-604-3501 FAX. No. 0237-43-5615
Design Department Quality Assurance Approved by Checked by Issued by
KYOCERA Crystal Device Corporation
Crystal Design Section
Crystal Units Division
A.Kikuchi
Y.Takahashi
T.Nitoube
M.Konno
Drawing No. K1101-13753-431 2/11
KYOCERA Crystal Device Corporation
KBS-5079E
Revision History
Rev.No. Description of revise Date Approved by Checked by Issued by
1 First Edition Jul.29,2013 Y.Takahashi T.Nitoube M.Konno
Drawing No. K1101-13753-431 3/11
KYOCERA Crystal Device Corporation
KBS-5079E
[PART NUMBER LIST]
Nominal
Frequency
(MHz)
KYOCERA Part Number ESR
()
Nominal
Frequency
Code
9.84375 CX3225GA09843D0PTVTT 500 9843
10 CX3225GA10000D0PTVTT 500 10000
12 CX3225GA12000D0PTVCC 300 12000
13.56 CX3225GA13560D0PTVCC 300 13560
16 CX3225GA16000D0PTVCC 100 16000
20 CX3225GA20000D0PTVCC 100 20000
24 CX3225GA24000D0PTVCC 100 24000
25 CX3225GA25000D0PTVCC 100 25000
26 CX3225GA26000D0PTVCC 100 26000
27 CX3225GA27000D0PTVCC 100 27000
28.63636 CX3225GA28636D0PTVCC 100 28636
30 CX3225GA30000D0PTVCC 100 30000
32 CX3225GA32000D0PTVCC 100 32000
40 CX3225GA40000D0PTVCC 100 40000
Referm K1101-13753-431 3/11 KYOCERA Pan Number
Drawing No. K1101-13753-431 4/11
KYOCERA Crystal Device Corporation
KBS-5079E
1. APPLICATION
This specification sheet is applied to quartz crystal “CX3225GB”
2. KYOCERA PART NUMBER
Refer to K1101-13753-431 3/11 KYOCERA Part Number
3. RATINGS
Items SYMB. Rating Unit Remarks
Operating Temperature Topr -40~+150 °C
Storage Temperature Range Tstg -40~+150 °C
4. CHARACTERISTICS
4-1 ELECTRICAL CHARACTERISTICS
1 Refer to K1101-13753-431 3/11 Nominal Frequency
2 Refer to K1101-13753-431 3/11 ESR
Items Electrical Specification Test Condition Remarks
SYMB. Min. Typ. Max. Unit
Mode of Vibration Fundamental
Nominal
Frequency
F0 1 MHz
Nominal
Temperature
TNOM +25 °C
Load Capacitance CL 8.0 pF
Frequency
Tolerance
df/F -50.0 +50.0
PPM
+253°C
Frequency
Temperature
Characteristics
df/F -150.0 +150.0 -40~+150°C
Frequency Aging
Rate
-5.0 +5.0 1 year +253°C
Equivalent Series
Resistance
ESR 2
Drive Level
Pd 0.01 200 μW
Insulation
Resistance
IR 500 M 100V(DC)
_>_'(_ 053i010 0.85i0.10 R 4»(R0.15) MARKING 1 Nominal Frequency Move the number of maximum indicafion beams of frequency in five digils, and omit less than kHz. 2 Idenlificafion 3 Dale Code Year- - -LAST1 DIGIT of YEAR AND WEEK (Ex) Jan. 1, 2013 a 301 4 Manufacturing Locafion F~~~KYOCERACrys1al Device Philippines, Inc 5 3 point glue mark ~11 MHZ D01 mark 11 MHZ~ No Dot mark 9K3 Reler to K1101-13753-431 3/11 Nomlnal Frequency Code The font 0! mfldng ls reference KYOCERA Crystal Device Corporation
Drawing No. K1101-13753-431 5/11
KYOCERA Crystal Device Corporation
KBS-5079E
5. APPEARANCES, PHYSICAL DIMENSION
OUTLINE DIMENSION (not to scale)
MARKING
1 Nominal Frequency Move the number of maximum indication beams of the
frequency to five digitsand omit less than kHz
2 Identification
3 Date Code YearLAST 1 DIGIT of YEAR AND WEEK
(Ex) Jan. 1, 2013 301
4 Manufacturing Location FKYOCERA Crystal Device Philippines, Inc
5 3 point glue mark ~11MHz Dot mark
11MHz~ No Dot mark
3 Refer to K1101-13753-431 3/11 Nominal Frequency Code
The font of marking is reference.
3
K301F
3.20±0.10
2.50±0.10
0.85±0.10
0.53±0.10
0.25
0.60±0.10
4-(R0.15)
0.50±0.10
R0.3
UNIT mm
1
2 3 4
5
KYOCERA Crystal Device Corporation
Drawing No. K1101-13753-431 6/11
KYOCERA Crystal Device Corporation
KBS-5079E
6. RECOMMENDED LAND PATTERN (not to scale)
2.6
1.
6
0.41.
6
UNIT : mm
"O 7-4.Specilication mdmwmeA 9 Mateuar ofthe mmeryape emu be PS (ESD). Mama: Dime sear rape snarl be pubesmESD) The sear rape snarl "alum/Brine swam rues/And n01 pmuem Ihe mmercape. Tensilesmanglh uflhetape. |0N or mare. The Rbrmmwmdesgmrm Is a ZRMAX, Dusargmemberween centers Dime mvlty and model we snarl be a 05mm mess. Cunuratme pnen tolerance of "PD“ shal be :uzmn at 10 prtnhes The number of Eek Is 01% 01 1 me ml pan mmber (me number of lhe tame term) orme panrurrmng w (am, the Irmg whm lack aflhe mmnuanue Is ml rn.) The mum on parts rs named ns unecmn ns erecum maladansncls equal. 1U.Pee|rng force Dflhe sealrape. 0,1 to IBM Cavertzpe p Wee KYOCERA Crystal Device Corporation
Drawing No. K1101-13753-431 7/11
KYOCERA Crystal Device Corporation
KBS-5079E
7.TAPING & REEL
7-1.Dimensions
7-2.Leader and trailer tape
7-3.DirectionThe direction shall be seen from the top cover tape side
7-4.Specification
1. Material of the carrier tape shall be PS (ESD).
2. Material of the seal tape shall be polyester(ESD).
3. The seal tape shall not cover the sprocket holes. And not protrude from the carrier tape.
4. Tensile strength of the tape : 10N or more.
5. The R of the corner without designation is 0.2RMAX.
6. Disalignment between centers of the cavity and sprocket hole shall be 0.05mm or less.
7. Cumulative pitch tolerance of “P0 shall be ±0.2mm at 10 pitches.
8. The number of lack is 0.1% of 1 reel total part number (the number of the table letters) or the part following whose 1 either is big.
(But, the thing which lack of the continuance is not in.)
9. The marking on parts is not fixed its direction, its electrical characteristic is equal.
10. Peeling force of the seal tape: 0.1 to 1.0N.
3.5±0.05
4.0±0.1
2.0±0.05
4.0±0.1
φ1.05±0.15 φ1.55±0.05
(3.7)
3.5±0.1
1.75±0.1
8.0±0.2
(3.0)
2.8±0.1
1.0±0.1
0.25±0.05
Unreeling direction
Cover tape
Career tape
Unreeling direction
400560mm
END
START
Leader
Empty compartment
Components
Empty compartment
100mm
160mm or more
or more
Drawing No. K1101-13753-431 8/11
KYOCERA Crystal Device Corporation
KBS-5079E
7-5.Reel specifications
(Nonconductor type Reel)
In the case of Φ180 Reel (3000 pcs max)
A B C D
Dimension φ180 +0/-1.5 φ60 +1/-0 φ13±0.2 φ21±0.8
Symbol E W t
Dimension 2.0±0.5 9±1 2.0±0.5
(Unit : mm)
C
D
E
B
Wt
Drawing No. K1101-13753-431 9/11
KYOCERA Crystal Device Corporation
KBS-5079E
8.Enviromental requirements
After following test, frequency shall not change more than ±10×10-6
And CI,±20% or 5Ωof large value.
8.1 Resistance to Shock Test condition
Natural dropped from height 100cm onto hard wood
board in 3 times
8.2 Resistance to Vibration Test condition
frequency 1055 10 Hz
Amplitude 1.5mm
Cycle time 15 minutes
Direction X,Y,Z (3direction),2 h each.
8.3 Resistance to Heat Test condition
The quartz crystal unit shall be stored at a
temperature of +150±2°C for 500 h.
Then it shal be subjected to standard atmospheric
conditions for 1 h ,after whichi measurement shall
be made.
8.4 Resistance to Cold Test condition
The quartz crystal unit shall be stored at a
temperature of 40±2°C for 500 h.
Then it shal be subjected to standard atmospheric
conditions for 1 h ,after whichi measurement shall
be made.
8.5 Thermal Shock Test condition
The quartz crystal unit shall be subjected to 500
succesive change of temperature cycles each as
shown in table belowThen it shall be subjected
to standard atmospheric conditions for 1hafter
which measurements shall be made.
Cycle :-40±2°C30min.to 25±C5min.
to +150±2°C30min.to 25±2°C5min.
o 4.—.— o 50 m 150 200 250 300 350 Timon-9.] Intensity for bending in Solder and ad KYOCERA Crystal Device Corporation
Drawing No. K1101-13753-431 10/11
KYOCERA Crystal Device Corporation
KBS-5079E
8.6 Resistance to Moisture Test condition
The quartz crystal unit shall be stored at a
temperature of 60±2°C wich relative humidity of
90% to 95% for 500 h. Then it shall be subjected
to standard atmospheric conditions for 1hafter
which measurements shall be made
8.7 Soldering condition 1. Material of solder
Kind lead free solder paste
Melting point +220±5°C
2. Reflow temp.profile
Frequency shift : ±2ppm
3. Hand Soldering +350°C 3 sec MAX
4. Reflow Times 2 times
Reflow temp.profile
8.8 Intensity for bending in circuit board
Solder this product in center of the circuit board of 40
mm
×100
mm
and add the deflection of 3mm as the bottom figure.
Test board : t1.6mm
Temp [°C] Time[sec]
Preheating +150 to +180 150 (typ.)
Peak +260±5 10 (max.)
To t al 300 (max.)
PUSH
board
45 45
1.6
UNIT : mm
R5
R340
10
20
press jig
Product
Drawing No. K1101-13753-431 11/11
KYOCERA Crystal Device Corporation
KBS-5079E
9.Cautions for use
1Automatic mounting machine use
Please use after affirmation that select the mounting machine model with a shock small if possible in
the case of use of an automatic mounting machine, and it does not have breakage. There is a risk of
a quartz crystal unit breakage occurring and not functioning normally by too much shock etc..
2Conformity of a circuit
In case of use of an oscillation circuit, please insert in a quartz crystal unit in series resistance 20 times
as many as the standard value of equivalent in-series resistance, and confirm oscillating. Please
remove resistance which inserted after the notes above-mentioned examination in the quartz crystal
unit in series, and use it.
3After making the Quartz Crystal mount on a printed circuit board ,if it is required to devide the printed
circuit board into another one, use it with attentive confirmation so that a warp cased by this dividing
might not affect any damage. When designing a printed circuit board as well as handling the mounting
As much as possible. The quartz crystal shall be passed through the reflow furnace. Then it shall be
subjected to standard atmospheric conditions, after which cleaning shall be made.
10.Storage conditions
Storage at prolonged high temperature or low temperature and the storage by high humidity cause
degradation of frequency accuracy, and degradation of soldering nature. Storage is performed at the
temperature of 18-30 degrees C, and the humidity of 20-70 Percent in the state of packing, and a term is 6
months.
11. Manufacturing location
KYOCERA Crystal Device Philippines, Inc.
12. Quality Assurance
Kyocera Crystal Device Quality Assurance Division
13. Quality guarantee
When the failure by the responsibility of our company occurs clearly after delivery within 1 year,
a substitute article etc. is appropriated gratuitously and this is guaranteed. However, when passing
1 year after delivery, there is a case where I am allowed to consider as onerous repair after both
consultation.
14.Others
When any questions and opinions are in the written matter of these delivery specifications, I will ask
connection of you from the our company issue day within 45 days. In a connection no case, a written
matter is consented to it and employed within a term.

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