ACS772 Datasheet by Allegro MicroSystems

@mL
Application 1: the ACS772 outputs an analog
signal, VOUT
, that varies linearly with the
bidirectional AC or DC primary sensed cur-
rent, IP
, within the range specified. RF and
CF are for optimal noise management, with
values that depend on the application.
ACS772
The Allegro™ ACS772 family of current sensor ICs provide
economical and precise solutions for AC or DC current sensing,
ideal for motor control, load detection and management, power
supply and DC-to-DC converter control, and inverter control.
The 2.5 µs response time enables overcurrent fault detection
in safety-critical applications.
The device consists of a precision, low-offset linear Hall
circuit with a copper conduction path located near the die.
Applied current flowing through this copper conduction path
generates a magnetic field which the Hall IC converts into a
proportional voltage. Device accuracy is optimized through the
close proximity of the magnetic signal to the Hall transducer.
A precise, proportional output voltage is provided by the
low-offset, chopper-stabilized BiCMOS Hall IC, which is
programmed for accuracy at the factory. Proprietary digital
temperature compensation technology greatly improves the
IC accuracy and temperature stability.
High-level immunity to current conductor dV/dt and stray
electric fields is offered by Allegro proprietary integrated shield
technology for low output voltage ripple and low offset drift
in high-side, high-voltage applications.
The output of the device increases when an increasing current
flows through the primary copper conduction path (from
terminal 4 to terminal 5), which is the path used for current
sampling. The internal resistance of this conductive path is
100μΩtypical,providinglowpowerloss.
The thickness of the copper conductor allows survival of the
device at high overcurrent conditions. The terminals of the
conductive path are electrically isolated from the signal leads
(pins 1 through 3). This allows the ACS772 family of sensor ICs
to be used in applications requiring electrical isolation without
the use of opto-isolators or other costly isolation techniques.
ACS772-DS, Rev. 11
MCO-0000363
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
Continued on the next page…
Typical Application
5 V
VOUT RF
CF
CBYP
0.1 µF
IP–
IP+
2GND
5
4
ACS772
3
1
VIOUT
VCC
IP
AEC-Q100 Grade 1 qualified
Typicalof2.5μsoutputresponsetime
5 V supply operation
Ultra-lowpowerloss:100μΩinternalconductorresistance
Reinforced galvanic isolation allows use in economical,
high-side current sensing in high-voltage systems
4800 Vrms dielectric strength certified under UL60950-1
Industry-leading noise performance with greatly
improved bandwidth through proprietary amplifier and
filter design techniques
Integrated shield greatly reduces capacitive coupling
from current conductor to die due to high dV/dt signals,
and prevents offset drift in high-side, high-voltage
applications
Greatly improved total output error through digitally
programmed and compensated gain and offset over the
full operating temperature range
Small package size, with easy mounting capability
Monolithic Hall IC for high reliability
Output voltage proportional to AC or DC currents
Factory-trimmed for accuracy
Extremely stable output offset voltage
Not to scale
DESCRIPTION
FEATURES AND BENEFITS
August 28, 2019
PFF
Leadform
PSF
Leadform
PACKAGE: 5-pin package (suffix CB)
PSS
Leadform
CB Certificate Number:
US-29755-UL
ALLEGRO
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
2
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
The device is fully calibrated prior to shipment from the factory.
The ACS772 family is lead (Pb) free. All leads are plated with 100%
DESCRIPTION (continued)
SELECTION GUIDE
Part Number [1]
Package Primary Sampled
Current , IP
(A)
Sensitivity
Sens (Typ.)
(mV/A) [2]
Nominal TA [3]
(°C) Packing [4]
Terminals Signal Pins
ACS772LCB-050U-PFF-T Formed Formed 50 80
–40 to 150
34 pieces
per tube
ACS772LCB-050B-PFF-T Formed Formed ±50 40
ACS772LCB-050B-PSS-T Straight Straight
ACS772LCB-100U-PFF-T Formed Formed 100 40
ACS772LCB-100B-PFF-T Formed Formed ±100 20
ACS772KCB-150U-PFF-T Formed Formed 150 26.66 –40 to 125
ACS772KCB-150B-PFF-T Formed Formed ±150 13.33
ACS772ECB-200U-PFF-T Formed Formed 200 20
–40 to 85
ACS772ECB-200B-PFF-T Formed Formed ±200 10
ACS772ECB-250U-PFF-T Formed Formed 250 16
ACS772ECB-250U-PSF-T Straight Formed
ACS772ECB-250B-PFF-T Formed Formed ±250 8
ACS772ECB-250B-PSF-T Straight Formed
ACS772ECB-300B-PFF-T Formed Formed ±300 6.66
ACS772ECB-400B-PFF-T Formed Formed ±400 5
[1] Additional leadform and Sensitivity options available for qualified volumes.
[2] Measured at VCC = 5 V.
[3] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded.
See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information.
[4] Contact Allegro for additional packing options.
ACS 772 L CB - 050 B T
Lead (Pb) Free
Output Directionality:
B – Bidirectional (positive and negative current)
U – Unidirectional (only positive current)
Current Sensing Range (A)
Package Designator
Operating Temperature Range
3 Digit Part Number
Allegro Current Sensor
- -
Lead Form
PFF
matte tin, and there is no Pb inside the package. The heavy gauge
leadframe is made of oxygen-free copper.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
3
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
ISOLATION CHARACTERISTICS
Characteristic Symbol Notes Rating Unit
Dielectric Surge Strength Test Voltage VSURGE
Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5
1.2 µs (rise) / 50 µs (width) 8000 V
Dielectric Strength Test Voltage [2] VISO
Agency type-tested for 60 seconds per UL standard
60950-1, 2nd Edition. Tested at 3000 VRMS for 1 second
in production.
4800 VRMS
Working Voltage for Basic Isolation VWVBI For basic (single) isolation per UL standard 60950-1, 2nd
Edition
990 VPK or VDC
700 VRMS
Working Voltage for Reinforced Isolation VWFRI For reinforced (double) isolation per UL standard 60950-1,
2nd Edition
636 VPK or VDC
450 VRMS
[2] Allegro does not conduct 60-second testing. It is done only during the UL certification process.
ABSOLUTE MAXIMUM RATINGS
Characteristic Symbol Notes Rating Unit
Supply Voltage VCC 6.5 V
Reverse Supply Voltage VRCC –0.5 V
Output Voltage VIOUT 6.5 V
Reverse Output Voltage VRIOUT –0.5 V
Output Source Current IOUT(Source) VIOUT to GND 3mA
Output Sink Current IOUT(Sink) Minimum pull-up resistor of 500 Ω from VCC to VIOUT 10 mA
Maximum Continuous Current ICMAX TA = 25°C 250 A
Operating Ambient Temperature [1] TARange E, K, and L –40 to 150 °C
Maximum Junction Temperature TJ(max) 165 °C
Storage Temperature Tstg –65 to 165 °C
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Thermal
Application section of this datasheet for more information.
TYPICAL OVERCURRENT CAPABILITIES [4][5]
Characteristic Symbol Notes Rating Unit
Overcurrent IPOC
TA = 25°C; current is on for 1 second and off for
99 seconds, 100 pulses applied 1200 A
TA = 85°C; current is on for 1 second and off for
99 seconds, 100 pulses applied 900 A
TA = 150°C; current is on for 1 second and off for
99 seconds, 100 pulses applied 600 A
[4] Test was done with Allegro evaluation board. The maximum allowed current is limited by TJ(max) only.
[5] For more overcurrent profiles, please see FAQ on the Allegro website, www.allegromicro.com.
ESD RATINGS
Characteristic Symbol Test Conditions Value Unit
Human Body Model VHBM Per AEC-Q100 ±6 kV
Charged Device Model VCDM Per AEC-Q100 ±1 kV
mwcrosystems ALLEGRO' EEC
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
4
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
IP–
IP+
VCC
GND
VIOUT
5
4
1
2
3
Terminal List Table
Number Name Description
1VCC Device power supply terminal
2GND Signal ground terminal
3VIOUT Analog output signal
4IP+ Terminal for current being sampled
5IP– Terminal for current being sampled
Functional Block Diagram
Pinout Diagram
EEPROM and
Control Logic
Active Temperature
Compensation
Signal Recovery
Charge Pump Pulse
Generator
Offset ControlSensitivity Control
Temperature
Sensor
Output Clamps
Undervoltage
Detection
Programming
Control
Dynamic Offset
Cancellation
To all subcircuits
IP–
IP+
GND
C
L
C
BYPASS
VCC
V
IOUT
THERMAL CHARACTERISTICS: May require derating at maximum conditions
Characteristic Symbol Test Conditions [3] Value Unit
Package Thermal Resistance RθJA
Mounted on the Allegro evaluation board with 2800 mm2
(1400 mm2 on component side and 1400 mm2 on opposite
side) of 4 oz. copper connected to the primary leadframe
and with thermal vias connecting the copper layers.
Performance is based on current flowing through the
primary leadframe and includes the power consumed by
the PCB.
7°C/W
[3] Additional thermal information available on the Allegro website.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
5
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Characteristic Symbol Test Conditions Min. Typ. Max. Unit
ELECTRICAL CHARACTERISTICS
Supply Voltage VCC 4.5 5 5.5 V
Supply Current ICC VCC = 5 V, no load on output 10 15 mA
Power-On Delay tPOD TA = 25°C 64 µs
Undervoltage Lockout (UVLO)
Threshold
[1]
VUVLOH VCC rising at 1 V/ms and device functions enabled –4– V
VUVLOL VCC falling at 1 V/ms and device functions enabled – 3.5 – V
UVLO Hysteresis VHYS(UVLO) 250 – mV
UVLO Enable/Disable Delay
Time [1]
tUVLOE Time measured from falling VCC < VUVLOH to UVLO
enabled – 64 – µs
tUVLOD Time measured from rising VCC > VUVLOH to UVLO
disabled – 7 – µs
Power-On Reset Voltage VPORH VCC rising at 1 V/ms – 2.9 – V
VPORL VCC falling at 1 V/ms – 2.5 – V
POR Hysteresis VHYS(POR) 250 – mV
Internal Bandwidth BWiSmall signal –3 dB, CL = 0.47 nF – 200 – kHz
Rise Time tr
IP step = 50% of IP+, 10% to 90% rise time, TA = 25°C,
COUT = 470 pF – 2.4 – µs
Propagation Delay Time tPROP TA = 25°C, CL = 470 pF, IP step = 50% of IP+ – 1.2 – µs
Response Time tRESPONSE TA = 25°C, CL = 470 pF, IP step = 50% of IP+,
90% input to 90% output – 2.5 – µs
DC Output Impedance ROUT TA = 25°C 3.3 Ω
Output Load Resistance RLOAD(MIN) VIOUT to GND, VIOUT to VCC 4.7 – kΩ
Output Load Capacitance CLOAD(MAX) VIOUT to GND 1 10 nF
Primary Conductor Resistance RPRIMARY TA = 25°C 100 µΩ
Output Saturation Voltage VSAT(HIGH) TA = 25°C, RL(PULLDWN) = 10 kΩ to GND VCC – 0.2 – – V
VSAT(LOW) TA = 25°C, RL(PULLUP) = 10 kΩ to VCC 200 mV
ERROR COMPONENTS
QVO Ratiometry Error [2] RatERRQVO VCC = 4.75 to 5.25 V – ±0.15 – %
Sens Ratiometry Error [2] RatERRSens VCC = 4.75 to 5.25 V – ±0.3 – %
Noise IN
Input referenced noise density; TA = 25°C, CL = 1 nF – 0.15 – mA / √¯(Hz)
Input referenced noise at 200 kHz; TA = 25°C, CL = 1 nF – 85 – mARMS
Nonlinearity [2] ELIN Up to full scale of IP–0.9 ±0.5 0.9 %
Symmetry [2] ESYM Over half-scale IP–0.8 ±0.4 0.8 %
[1] UVLO feature is only available on part numbers programmed to work at VCC = 5 V.
[2] See Characteristic Definitions section of this datasheet.
COMMON OPERATING CHARACTERISTICS: Valid at TA = –40°C to 150°C, CBYP = 0.1 µF, and VCC = 5 V, unless otherwise specified
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
6
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X050U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 50 A
Sensitivity Sens IPR(min) < IP < IPR(max) 80 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A VCC / 10 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 20.4 mVp-p
TA = 25°C, CL = 1 nF 3.4 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.7 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 120 250 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
7
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X050B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –50 – 50 A
Sensitivity Sens IPR(min) < IP < IPR(max) 40 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A VCC / 2 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 20.4 mVp-p
TA = 25°C, CL = 1 nF 3.4 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.7 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 210 250 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
8
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X100U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 100 A
Sensitivity Sens IPR(min) < IP < IPR(max) 40 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A VCC / 10 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 20.4 mVp-p
TA = 25°C, CL = 1 nF 3.4 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.7 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 280 400 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
9
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X100B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –100 – 100 A
Sensitivity Sens IPR(min) < IP < IPR(max) 20 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A VCC / 2 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 20.4 mVp-p
TA = 25°C, CL = 1 nF 3.4 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.7 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 175 400 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
10
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X150U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 150 A
Sensitivity Sens IPR(min) < IP < IPR(max) 26.66 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A VCC / 10 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 20.4 mVp-p
TA = 25°C, CL = 1 nF 3.4 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.7 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 280 400 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
11
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X150B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –150 – 150 A
Sensitivity Sens IPR(min) < IP < IPR(max) 13.33 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A VCC / 2 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 7.2 mVp-p
TA = 25°C, CL = 1 nF 1.2 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.7 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 280 400 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
12
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X200U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 200 A
Sensitivity Sens IPR(min) < IP < IPR(max) 20 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A VCC / 10 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 7.2 mVp-p
TA = 25°C, CL = 1 nF 1.2 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.5 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.7 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.5 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –20 ±6 20 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 160 400 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
13
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X200B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –200 – 200 A
Sensitivity Sens IPR(min) < IP < IPR(max) 10 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A VCC / 2 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 5.1 mVp-p
TA = 25°C, CL = 1 nF 0.85 mVRMS
Sensitivity Error ESens
Full scale of IP
, TA = 25°C –1 ±0.5 1 %
Full scale of IP
, TA = 25°C to 150°C –1.25 ±0.7 1.25 %
Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.5 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 380 400 mA
Total Output Error ETOT(HT) Full scale of IP
, TA = 25°C to 150°C –1.5 ±0.7 1.5 %
ETOT(LT) Full scale of IP
, TA = –40°C to 25°C –3.5 ±1.5 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
14
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X250U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 250 A
Sensitivity Sens IPR(min) < IP < IPR(max) 16 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A VCC / 10 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 5.1 mVp-p
TA = 25°C, CL = 1 nF 0.85 mVRMS
Sensitivity Error ESens
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.25 ±0.8 1.25 %
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 200 400 mA
Total Output Error
ETOT(HT) IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
15
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X250B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –250 – 250 A
Sensitivity Sens IPR(min) < IP < IPR(max) 8 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A VCC / 2 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 5.1 mVp-p
TA = 25°C, CL = 1 nF 0.85 mVRMS
Sensitivity Error ESens
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.25 ±0.8 1.25 %
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 175 400 mA
Total Output Error
ETOT(HT) IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
16
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X300B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –300 – 300 A
Sensitivity Sens IPR(min) < IP < IPR(max) 6.66 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A VCC / 2 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 5.1 mVp-p
TA = 25°C, CL = 1 nF 0.85 mVRMS
Sensitivity Error ESens
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.25 ±0.8 1.25 %
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 175 400 mA
Total Output Error
ETOT(HT) IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
17
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
X400B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC
= 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –400 – 400 A
Sensitivity Sens IPR(min) < IP < IPR(max) 5 ×
VCC / 5 mV/A
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A VCC / 2 V
ACCURACY PERFORMANCE
Noise VN
TA = 25°C, CL = 1 nF 5.1 mVp-p
TA = 25°C, CL = 1 nF 0.85 mVRMS
Sensitivity Error ESens
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.25 ±0.8 1.25 %
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
Electrical Offset Error
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) 175 400 mA
Total Output Error
ETOT(HT) IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C –1.5 ±0.9 1.5 %
ETOT(LT) IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
mt nl‘C arc Van: nl‘C _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
18
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
-10
-8
-6
-4
-2
0
2
4
6
8
10
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
78.5
79
79.5
80
80.5
81
81.5
82
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
-0.2
-0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
0
20
40
60
80
100
120
140
160
180
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-050U-PFF-T
um ""3 we we nl‘C _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
19
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-050B-PFF-T
-6
-4
-2
0
2
4
6
8
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
39.4
39.6
39.8
40
40.2
40.4
40.6
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-1.5
-1
-0.5
0
0.5
1
1.5
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
0
20
40
60
80
100
120
140
160
180
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
var: um nl‘C "N nl‘C _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
20
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-100U-PFF-T
-4
-2
0
2
4
6
8
10
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
39.4
39.6
39.8
40
40.2
40.4
40.6
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
0
50
100
150
200
250
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
mt mt nl‘c tare nl‘C _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
21
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-100B-PFF-T
-6
-4
-2
0
2
4
6
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
19.6
19.7
19.8
19.9
20
20.1
20.2
20.3
20.4
20.5
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
0
50
100
150
200
250
300
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
an arc van: ""3 are _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
22
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772KCB-150U-PFF-T
-4
-3
-2
-1
0
1
2
3
4
5
6
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
26.2
26.3
26.4
26.5
26.6
26.7
26.8
26.9
27
27.1
27.2
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.1
0.2
0.3
0.4
0.5
0.6
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
0
50
100
150
200
250
300
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
mt are , ‘1 mt nl‘C _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
23
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772KCB-150B-PFF-T
-4
-2
0
2
4
6
8
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
13.1
13.2
13.3
13.4
13.5
13.6
13.7
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
3
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
0
50
100
150
200
250
300
350
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
um mt + Mean + a sigma —.— Mean + Mean—1! sigma mt ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
24
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-200U-PFF-T
-6
-4
-2
0
2
4
6
8
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
19.4
19.5
19.6
19.7
19.8
19.9
20
20.1
20.2
20.3
20.4
20.5
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-3
-2
-1
0
1
2
3
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
0
50
100
150
200
250
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
an arc van Yalt nl‘C _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
25
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-200B-PFF-T
9.8
9.85
9.9
9.95
10
10.05
10.1
10.15
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.1
0.2
0.3
0.4
0.5
0.6
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
-6
-5
-4
-3
-2
-1
0
1
2
3
4
5
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
0
50
100
150
200
250
300
350
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
arc um mt urn nl‘C + Mean + 3 sigma —.— Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
26
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-250U-PFF-T
-4
-2
0
2
4
6
8
10
12
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
15.7
15.75
15.8
15.85
15.9
15.95
16
16.05
16.1
16.15
16.2
16.25
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
0.45
0.5
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
0
50
100
150
200
250
300
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
nfi.‘ "W are are nl‘C _-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
27
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-250B-PFF-T
-6
-4
-2
0
2
4
6
-50 -25 025 50 75 100 125 150
Voe(mV)
Ta(
)
Electrical Offset Voltage versus Ambient Temperature
7.85
7.9
7.95
8
8.05
8.1
8.15
-50 -25 025 50 75 100 125 150
Sens(mV/A)
Ta(
)
Sensitivity versus Ambient Temperature
0
0.1
0.2
0.3
0.4
0.5
0.6
-50 -25 025 50 75 100 125 150
Elin(%)
Ta(
)
Nonlinearity versus Ambient Temperature
-1.5
-1
-0.5
0
0.5
1
1.5
2
-50 -25 025 50 75 100 125 150
Error(%)
Ta(
)
Total Output Error versus Ambient Temperature
0
50
100
150
200
250
300
350
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta(
)
Magnetic Offset Error versus Ambient Temperature
_-— Mun + 3 sigml + Mean + Mean — a sigma ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
28
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-400B-PFF-T
-6
-4
-2
0
2
4
6
-50 -25 025 50 75 100 125 150
Vo e (m V)
Ta()
Electrical Offset Voltage versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
4.9
4.92
4.94
4.96
4.98
5
5.02
5.04
5.06
5.08
5.1
5.12
-50 -25 025 50 75 100 125 150
S e n s( m V/A )
Ta()
Sensitivity versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
-50 -25 025 50 75 100 125 150
Elin(%)
Ta()
Nonlinearity versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
3
-50 -25 025 50 75 100 125 150
Error(%)
Ta()
Total Output Error versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
0
50
100
150
200
250
300
350
-50 -25 025 50 75 100 125 150
Ierrom(mA)
Ta()
Magnetic Offset Error versus Ambient Temperature
Avg-3σ
Avg
Avg+3σ
I I I I I : tRESPDNSE I I I I I 9‘ I4—D I I I I 0?) h 1 ris TA CBVPASS CLOAD I , I : I E I : I : . I : I , I : i I E . I , ‘ I : I : [PROP Ins: us xx I nuns 1mm 9115M ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
29
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
CHARACTERISTIC PERFORMANCE DATA
Response Time (tRESPONSE)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
Propagation Delay (tPROP)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
mm w u: m was”; Hm 413nm: ALLEGRO' mtcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
30
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Rise Time (tR)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
m m X. ‘92»: 5mm x2: Assam-1m): “mm: x mus» w mm x; mum” m: «mam ALLEGRO' microsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
31
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
UVLO Enable Time (tUVLOE)
VCC 5 V to 3 V fall time = 1.5 µs, CL = 1 nF
UVLO Disble Time (tUVLOD)
VCC 3 V to 5 V recovery time = 1.5 µs, CL = 1 nF
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
32
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Definitions of Accuracy Characteristics
CHARACTERISTIC DEFINITIONS
SENSITIVITY (Sens)
The change in sensor IC output in response to a 1 A change
through the primary conductor. The sensitivity is the product
of the magnetic circuit sensitivity (G / A; 1 G = 0.1 mT) and the
linear IC amplifier gain (mV/G). The linear IC amplifier gain is
programmed at the factory to optimize the sensitivity (mV/A) for
the full-scale current of the device.
SENSITIVITY ERROR (ESens)
The sensitivity error is the percent difference between the mea-
sured sensitivity and the ideal sensitivity. For example, in the case
of VCC = 5 V:
=× 100 (%)
ESens
SensMeas(5V) SensIdeal(5V)
SensIDEAL(5V)
NOISE (VN)
The noise floor is derived from the thermal and shot noise
observed in Hall elements. Dividing the noise (mV) by the sensi-
tivity (mV/A) provides the smallest current that the device is able
to resolve.
NONLINEARITY (ELIN)
The ACS772 is designed to provide a linear output in response
to a ramping current. Consider two current levels: I1 and I2. Ide-
ally, the sensitivity of a device is the same for both currents, for
a given supply voltage and temperature. Nonlinearity is present
when there is a difference between the sensitivities measured at
I1 and I2. Nonlinearity is calculated separately for the positive
(ELINpos ) and negative (ELINneg ) applied currents as follows:
ELINpos = 100 (%) × {1 – (SensIPOS2 / SensIPOS1
) }
ELINneg = 100 (%) × {1 – (SensINEG2 / SensINEG1
)}
where:
SensIx = (VIOUT(Ix) – VIOUT(Q))/ Ix
and IPOSx and INEGx are positive and negative currents and IPOS2
= 2 × IPOS1 and INEG2 = 2 × INEG1.
Then:
ELIN = max( ELINpos , ELINneg )
SYMMETRY (ESYM)
The degree to which the absolute voltage output from the IC var-
ies in proportion to either a positive or negative half-scale primary
current. The following equation is used to derive symmetry:
100 ×
(
VIOUT_+half-scale amperes – VIOUT(Q)
VIOUT(Q) – VIOUT_–half-scale amperes
)
RATIOMETRY ERROR
The device features a ratiometric output. This means that the
quiescent voltage output, VIOUTQ, and the magnetic sensitivity,
Sens, are proportional to the supply voltage, VCC.The ratiometric
change (%) in the quiescent voltage output is defined as:
RatErrQVO = (VIOUTQ(VCC) / VIOUTQ(5V))
VCC / 5 V × 100%
[ ]
1 –
and the ratiometric change (%) in sensitivity is defined as:
RatErrSens = 1 – (Sens(VCC) / Sense(5V))
VCC / 5 V × 100%
[ ]
ZERO CURRENT OUTPUT VOLTAGE (VIOUT(Q))
The output of the sensor when the primary current is zero. It
nominally remains at 0.5 × VCC for a bidirectional device and 0.1
× VCC for a unidirectional device. For example, in the case of a
bidirectional output device, VCC = 5 V translates into VIOUT(Q) =
2.5 V. Variation in VIOUT(Q) can be attributed to the resolution of
the Allegro linear IC quiescent voltage trim and thermal drift.
ELECTRICAL OFFSET VOLTAGE (VOE)
The deviation of the device output from its ideal quiescent value
of 0.5 × VCC (bidirectional) or 0.1 × VCC (unidirectional) due to
nonmagnetic causes. To convert this voltage to amperes, divide by
the device sensitivity, Sens.
MAGNETIC OFFSET ERROR (IERROM)
The magnetic offset is due to the residual magnetism (remnant
field) of the core material. The magnetic offset error is highest
when the magnetic circuit has been saturated, usually when the
device has been subjected to a full-scale or high-current overload
condition. The magnetic offset is largely dependent on the mate-
rial used as a flux concentrator. The larger magnetic offsets are
observed at the lower operating temperatures.
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
33
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
TOTAL OUTPUT ERROR (ETOT)
The difference between the current measurement from the sensor
IC and the actual current (IP), relative to the actual current. This
is equivalent to the difference between the ideal output voltage
and the actual output voltage, divided by the ideal sensitivity,
relative to the current flowing through the primary conduction
path:
ETOT(IP) = VIOUT(IP) – VIOUT(ideal)(IP)
Sens
ideal
× I
P
× 100(%)
where
VIOUT(ideal)(IP) = VIOUT(Q) + (SensIDEAL × IP )
The Total Output Error incorporates all sources of error and is a
function of IP
.
At relatively high currents, ETOT will be mostly due to sensitiv-
ity error, and at relatively low currents, ETOT will be mostly due
to Offset Voltage (VOE). In fact, as IP approaches zero, ETOT
approaches infinity due to the offset voltage. This is illustrated
in Figure 1 and Figure 2. Figure 1 shows a distribution of output
voltages versus IP at 25°C and across temperature. Figure 2
shows the corresponding ETOT versus IP.
0 A
Decreasing
VIOUT (V)
Accuracy Across
Temperature
Accuracy Across
Temperature
Accuracy Across
Temperature
Accuracy at
25°C Only
Accuracy at
25°C Only
Accuracy at
25°C Only
Increasing
VIOUT (V)
Ideal VIOUT
IPR(min)
IPR(max)
+IP (A)
–IP (A)
VIOUT(Q)
Full Scale IP
Figure 1: Output Voltage versus Sensed Current Figure 2: Total Output Error versus Sensed Current
+IP
–IP
+ETOT
–ETOT
Across Temperature
25°C Only
1‘: time a mmlm wnhm ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
34
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Figure 3: Power-On Delay (tPOD)
Definitions of Dynamic Response Characteristics
POWER-ON DELAY (tPOD)
When the supply is ramped to its operating voltage, the device
requires a finite time to power its internal components before
responding to an input magnetic field. Power-On Delay, tPOD, is
defined as the time it takes for the output voltage to settle within
±10% of its steady-state value under an applied magnetic field,
after the power supply has reached its minimum specified operat-
ing voltage, VCC(min), as shown in the chart at right.
RISE TIME (tr)
The time interval between a) when the sensor reaches 10% of
its full-scale value, and b) when it reaches 90% of its full-scale
value.
PROPAGATION DELAY (tPROP)
The time interval between a) when the sensed current reaches
20% of its full-scale value, and b) when the sensor output reaches
20% of its full-scale value.
RESPONSE TIME (tRESPONSE)
The time interval between a) when the applied current reaches
90% of its final value, and b) when the sensor reaches 90% of its
output corresponding to the applied current.
Primary Current
VIOUT
90
10
20
0
(%)
Propagation Delay, tPROP
Rise Time, tr
t
V
+t
VCC
VCC(min)
VIOUT
90% VIOUT
0
t1= time at which power supply reaches
minimum specified operating voltage
t2=
time at which output voltage settles
within ±10% of its steady-state value
under an applied magnetic field
t1t2
tPOD
V
CC
(typ)
Figure 4: Rise Time (tr) and Propagation Delay (tPROP)
Primary Current
VIOUT
90
0
(%)
Response Time, tRESPONSE
t
Figure 5: Response Time (tRESPONSE)
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
35
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
FUNCTIONAL DESCRIPTION
The descriptions in this section assume: temperature = 25°C, no
output load (RL, CL), and no significant magnetic field is present.
Power-Up
At power-up, as VCC ramps up, the output is in a high-impedance
state. When VCC crosses VPORH (location [1] in Figure 6and[1′]
in Figure 7), the POR Release counter starts counting for tPORR
.
At this point, if VCC exceeds VUVLOH [2′],theoutputwillgoto
VCC / 2 after tUVLOD[3′].
If VCC does not exceed VUVLOH [2], the output will stay in the
high-impedance state until VCC reaches VUVLOH [3] and then will
go to VCC / 2 after tUVLOD [ 4 ].
VCC drops below VCC(min) = 4.5 V
If VCC drops below VUVLOL [4′,5],theUVLOEnableCounter
starts counting. If VCC is still below VUVLOL when the counter
reaches tUVLOE
, the UVLO function will be enabled and the
ouput will be pulled near GND [ 6 ] . If VCC exceeds VUVLOL
before the UVLO Enable Counter reaches tUVLOE[5′],theoutput
will continue to be VCC / 2.
Coming Out of UVLO
While UVLO is enabled [ 6 ] , if VCC exceeds VUVLOH [ 7 ] ,
UVLO will be disabled after tUVLOD , and the output will be
VCC / 2 [ 8 ] .
Power-Down
As VCC ramps down below VUVLOL[6′,9],theUVLOEnable
Counter will start counting. If VCC is higher than VPORL when
the counter reaches tUVLOE , the UVLO function will be enabled
and the output will be pulled near GND [ 10 ] . The output will
enter a high-impedance state as VCC goes below VPORL [ 11 ] . If
VCC falls below VPORL before the UVLO Enable Counter reaches
tUVLOE , the output will transition directly into a high-impedance
state[7′].
Power-On Reset (POR) and Undervoltage
Lockout (UVLO) Operation
EEPROM Error Checking And Correction
Hamming code methodology is implemented for EEPROM
checking and correction. The device has ECC enabled after
power-up. If an uncorrectable error has occurred, the VOUT pin
will go to high impedance and the device will not respond to
applied magnetic field.
mwcrosystems ALLEGRO'
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
36
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
tUVLOE
tPORR
tPORR
tUVLOD
tUVLOD
tUVLOD
t
UVLOE
1
1 2 4’ 5 6’ 7’
3
2
5.0
VUVLOH
VUVLOH
VPORH
VPORL
VPORH
VPORL
VUVLOL
VUVLOL
2.5
High Impedance High Impedance
High Impedance High Impedance
Slope =
VCC /
2
Slope =
VCC /
2
GND Time
Time
Time
Time
GND
VCC
VCC
VOUT
5.0
2.5
GND
GND
VOUT
356711
8
10
9
4
Slope =
VCC /
2
<
tUVLOE
<
tUVLOE
Figure 6: POR and UVLO Operation: Slow Rise Time Case
Figure 7: POR and UVLO Operation: Fast Rise Time Case
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
37
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Chopper Stabilization Technique
Amp
Regulator
Clock/Logic
Hall Element
Tuned
Filter
Anti-Aliasing
LP Filter
Figure 8: Concept of Chopper Stabilization Technique
When using Hall-effect technology, a limiting factor for
switchpoint accuracy is the small signal voltage developed across
the Hall element. This voltage is disproportionally small relative to
the offset that can be produced at the output of the Hall sensor IC.
This makes it difficult to process the signal while maintaining an
accurate, reliable output over the specified operating temperature
and voltage ranges.
Chopper stabilization is a unique approach used to minimize
Hall offset on the chip. Allegro employs a technique to remove
key sources of the output drift induced by thermal and mechani-
cal stresses. This offset reduction technique is based on a signal
modulation-demodulation process. The undesired offset signal is
separated from the magnetic field-induced signal in the frequency
domain, through modulation. The subsequent demodulation acts
as a modulation process for the offset, causing the magnetic field-
induced signal to recover its original spectrum at baseband, while
the DC offset becomes a high-frequency signal. The magnetic-
sourced signal then can pass through a low-pass filter, while the
modulated DC offset is suppressed.
In addition to the removal of the thermal and stress related offset,
this novel technique also reduces the amount of thermal noise
in the Hall sensor IC while completely removing the modulated
residue resulting from the chopper operation. The chopper sta-
bilization technique uses a high-frequency sampling clock. For
demodulation process, a sample-and-hold technique is used. This
high-frequency operation allows a greater sampling rate, which
results in higher accuracy and faster signal-processing capability.
This approach desensitizes the chip to the effects of thermal and
mechanical stresses, and produces devices that have extremely
stable quiescent Hall output voltages and precise recoverabil-
ity after temperature cycling. This technique is made possible
through the use of a BiCMOS process, which allows the use of
low-offset, low-noise amplifiers in combination with high-density
logic integration and sample-and-hold circuits.
/ ’4 // or’ o 10 40 so so 100 120 140 150 130 200 Continuous Cunant [Al ” Change in D Tampuaiure 350 300 250 N. 200 150 100 m c) Contlnuous current (A) 25 so 75 100 125 150 175 Amhlenl Yemperalure (-C) ALLEGRO' mmmsystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
38
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
APPLICATION INFORMATION
Thermal Rise vs. Primary Current
Self-heating due to the flow of current should be considered dur-
ing the design of any current sensing system. The sensor, printed
circuit board (PCB), and contacts to the PCB will generate heat
as current moves through the system.
The thermal response is highly dependent on PCB layout, copper
thickness, cooling techniques, and the profile of the injected current.
The current profile includes peak current, current “on-time”, and
duty cycle. While the data presented in this section was collected
with direct current (DC), these numbers may be used to approximate
thermal response for both AC signals and current pulses.
The plot in Figure 9 shows the measured rise in steady-state die
temperature of the ACS772 versus continuous current at an ambi-
ent temperature, TA, of 25°C. The thermal offset curves may be
directly applied to other values of TA. Conversely, Figure 10 shows
the maximum continuous current at a given TA. Surges beyond the
maximum current listed in Figure 10 are allowed given the maxi-
mum junction temperature, TJ(MAX)(165℃),isnotexceeded.
Figure 9: Self-Heating in the CB Package
Due to Current Flow
Figure 10: Maximum Continuous Current at a Given TA
The thermal capacity of the ACS772 should be verified by the
end user in the application’s specific conditions. The maximum
junction temperature, TJ(MAX)(165℃),shouldnotbeexceeded.
Further information on this application testing is available in
the DC and Transient Current Capability application note on the
Allegro website.
ASEK772 Evaluation Board Layout
Thermal data shown in Figure 9 was collected using the
ASEK772 Evaluation Board (TED-85-0385-001). This board
includes 2664 mm2 of 4 oz. copper (0.1388 mm) connected to
pins 4 and 5 with thermal vias connecting the layers. Top and bot-
tom layers of the PCB are shown below in Figure 11.
Figure 11: Top and Bottom Layers
for ASEK772 Evaluation Board
Gerber files for the ASEK772 evaluation board are available for
download from the Allegro website. See the technical documents
section of the ACS772 device webpage.
For Reference Only— Not for Tooling Use j ,,,,,, {A \ i fiL CD J v 0 1 "W H» :[ L. DDD L A PCB La out Reference View A l—Il—I O 02 ‘uuu Slandard Brandin Reference \fiew ALLEGRO' mwcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
39
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Figure 12: Package CB, 5-Pin, Leadform PFF
Creepage distance, current terminals to signal pins: 7.25 mm
Clearance distance, current terminals to signal pins: 7.25 mm
Package mass: 4.63 g typical
For Reference Only Not for Tooling Use
(Reference DWG-9111 & DWG-9110)
Dimensions in millimeters –NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
4
R1 = 1.0
1.91
3
21.4
0.5
R3 = 3.0
Ø0.8
Ø1.5
Ø0.5
R2 = 2.05
±2°
±5°
23
17.5 ±0.2
2.9 ±0.2
3.5 ±0.2
3.5 ±0.2
1.50 ±0.10
1
45
A
B
Branded
Face
0.381 +0.060
–0.030
1
A
B
B
C
C
XXXXXXX
XXX-XXX
XXXXXXX
XXXX
Dambar removal intrusion
Perimeter through-holes recommended
PCB Layout Reference View
Lines 1, 2, 3, 4 = 7 characters.
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
Standard Branding Reference View
Branding scale and appearance at supplier discretion
14.0 ±0.2
4.0 ±0.2
3.0 ±0.2
10.00 ±0.10
0.51 ±0.10
7.00 ±0.10
1.9 ±0.2
13.00 ±0.10
4.40 ±0.10
PACKAGE OUTLINE DRAWING
For Reference Only— Not for Tooling Use 13 an AFCB La out Reference Vwew l—I l—I 4i 0 )2 TH ‘u u LI j ASIandard Brandm Referencveew W j ALLEGRO' mwcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
40
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Figure 13: Package CB, 5-Pin, Leadform PSF
For Reference Only Not for Tooling Use
(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
45
A2.75 ±0.10
1.50 ±0.10
14.0 ±0.2
4.0 ±0.2
3.0 ±0.2
10.00 ±0.10
7.00 ±0.10
13.00 ±0.10
4.40 ±0.10
23.50 ±0.5
Branded
Face
ADambar removal intrusion
231
0.51 ±0.10
1.9 ±0.2
5º±5°
2.9 ±0.2
3.5 ±0.2
0.381 +0.060
–0.030
1.91
0.8
1.5
BPCB Layout Reference View
B
C
Perimeter through-holes recommended
Branding scale and appearance at supplier discretion
1
C
XXXXXXX
XXX-XXX
XXXXXXX
XXXX
Lines 1, 2, 3, 4 = 7 characters.
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
Standard Branding Reference Vi
ew
“ “3%; A PCB La oul Reference Vxew I_II_I O O )7 I I] I] I] A S|andard Brandin Reference Vxew I>DI> ALLEGRO' mIcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
41
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
Figure 14: Package CB, 5-Pin, Leadform PSS
For Reference Only–Not for Tooling Use
(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
2 31
45
A2.75 ±0.10
3.18 ±0.10
1.50 ±0.10
14.0 ±0.2
4.0 ±0.2
3.0 ±0.2
10.00 ±0.10
0.51 ±0.10
7.00 ±0.10
1.9 ±0.2
13.00 ±0.10
4.40 ±0.10
11.0 ±0.05
23.50 ±0.5
0.381+0.060
–0.030
Branded
Face
ADambar removal intrusion
1.91
0.8
1.5
BPCB Layout Reference View
B
C
Perimeter through-holes recommended
Branding scale and appearance at supplier discretion
1
C
XXXXXXX
XXX-XXX
XXXXXXX
XXXX
Lines 1, 2, 3, 4 = 7 characters.
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
Standard Branding Reference View
ALLEGRO' mxcrosystems
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
42
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
For the latest version of this document, visit our website:
www.allegromicro.com
Copyright 2019, Allegro MicroSystems.
Allegro MicroSystems reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit
improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the
information being relied upon is current.
Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of
Allegro’s product can reasonably be expected to cause bodily harm.
The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems assumes no responsibility for its use; nor
for any infringement of patents or other rights of third parties which may result from its use.
Copies of this document are considered uncontrolled documents.
Revision History
Number Date Description
December 12, 2017 Initial release
1January 30, 2018 Added Dielectric Surge Strength Test Voltage characteristic (page 3) and EEPROM Error Checking
and Correction section (page 16)
2May 14, 2018 Added -050U, -100B, -150U, -200U, -250U, and -250B part options
3September 24, 2018 Added -PSF leadform option; updated Magnetic Offset Error value (page 13) and Characteristic
Performance Data charts (pages 26 to 28)
4November 12, 2018
Added -300B part option (page 2 and 16); added -PSS leadform option (pages 1, 2, and 39) and
Applications Information section (page 36); updated Typical Application (page 1), pinout diagram
(page 4), and TOP to TA (pages 2 and 5-15).
5December 13, 2018 Added UL certificate; updated package outline drawing PCB layouts and branding (pages 37-39)
6January 7, 2019 Corrected Sensitivity Error values for -200U part option (page 12)
7January 24, 2019 Added -400B part option (page 2 and 17)
8March 14, 2019 Updated package branding (pages 38-40) and Temperature ratings (pages 2-3, 6-17)
9June 27, 2019 Corrected EVB copper thickness (page 37)
10 August 1, 2019 Added -400B Characteristic Performance Data charts (page 28)
11 August 28, 2019 Added Maximum Continuous Current to Absolute Maximum Ratings table (page 3),
ESD ratings table (page 3), and updated thermal data section (page 38)