OPA828 JFET Input Op-Amp

Texas Instruments' op-amp is well-suited for a variety of test equipment and data acquisition systems

Image of Texas Instruments' OPA828 JFET Input Op AmpTexas Instruments' OPA828 JFET is the next generation OPA627 and OPA827 op-amp combining high speed with high DC precision and AC performance. This op-amp supplies low-offset voltage (50 μV), low-drift overtemperature (0.45 μV/°C typical), low bias current (1 pA typical), and low noise (4 nV/√Hz typical) with only 60 nVRMS 0.1 Hz to 10 Hz noise. The OPA828 operates over a wide supply voltage range from ±4 V to ±18 V on a supply current of 5.5 mA per channel (typical).

AC characteristics such as a 45 MHz gain-bandwidth product (GBW), a slew rate of 150 V/μs, and precision DC characteristics make the OPA828 an excellent choice for a variety of systems. These include high-speed and high-resolution data acquisition (DAQ) systems including 16- to 18-bit mixed signal systems, transimpedance (I/V-conversion) amplifiers, filters, precision ±10 V front-ends, and high impedance sensor-interface applications.

The OPA828 is available in the industry-standard 8-pin SOIC surface-mount package and is specified from -40°C to +125°C.

Features
  • Low input voltage noise density: 4 nV/√Hz at 1 kHz
  • Input voltage noise: 0.1 Hz to 10 Hz: 60 nVRMS
  • Low-input bias current: 1 pA
  • Input-offset voltage: 50 µV
  • Input-offset drift: 0.45 µV/°C
  • Mux-friendly inputs
  • Gain-bandwidth: 45 MHz
  • Slew rate: 150 V/µs
  • 14-bit settling time: 120 ns
  • Overload power limiter
  • Wide supply voltage range: ±4 V to ±18 V
  • Package: 8-pin SOIC
Applications
  • DAQ systems
  • Optical modules
  • Seismic test equipment
  • Mixed modules
  • Ultrasound scanners

OPA828 Op-Amp

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9975 - Lagerbestand des Herstellers
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Veröffentlicht: 2019-04-02